Hi, I am Erry Yulian Triblas Adesta, My LiveDNA is 62.1437
 
   
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Dr. Erry Yulian Triblas Adesta
 
Highest Degree: Ph.D. in Manufacturing Systems from The University of Huddersfield, Huddersfield, West Yorkshire, England, UK
 
Institute: International Islamic University Malaysia, Kuala Lumpur, Malaysia
 
Area of Interest: Engineering
  •   Manufacturing System Engineering
  •   Manufacturing Engineering
  •   Engineering Project Management
  •   Supply Chain Management
 
URL: http://livedna.org/62.1437
 
My SELECTED Publications
1:   Adesta, E.Y.T., A.M. Ali, D. Agusman, M. Riza and M.Y. Suprianto, 2010. A study of parameters relationship to backcutting phenomena during high speed end milling of AISI H13. Am. J. Applied Sci., 7: 1420-1425.
2:   Adesta, E.Y.T., M. Hazza, M. Riza, D. Agusman and Rosehan, 2010. Tool life estimation model based on simulated flank wear during high speed hard turning. Eur. J. Sci. Res., 39: 265-278.
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3:   Adesta, E.Y.T., M. Hazza, Rosehan and M. Riza, 2008. The development of cost structure for high speed hard turning. Int. J. Sci. Eng. Technol., 1: 47-54.
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4:   Adesta, E.Y.T., M. Riza, M. Hazza, D. Agusman and Rosehan, 2009. Tool wear and surface finish investigation in high speed turning using cermet insert by applying negative rake angles. Eur. J. Sci. Res., 38: 180-188.
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5:   Ali, M.Y., A.N.M. Karim, E.Y.T. Adesta and A.F. Ismail, 2010. Comparative study of conventional and micro WEDM based on machining of meso/micro sized spur gear. Int. J. Precision Eng. Manuf., 11: 779-784.
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6:   Aminanda, Y., A.G.E. Sutjipto, E.Y.T. Adesta and B. Castanie, 2011. Simulation of compression and spring-back phenomena of sandwich structure with honeycomb core subjected to low energy and low velocity impact. Key Eng. Mater., 462-463: 1296-1301.
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7:   Konneh, M., E.Y.T. Adesta and S. Izman, 2008. Diamond grits effect on the morphology of ground hard-brittle silicon. Int. J. Sci. Eng. Technol., 1: 72-76.
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8:   Sutjipto, A.G.E., Jufriadi, R. Muhida, Afzeri and E.Y.T. Adesta, 2010. Modeling electric field distribution on insulator under electron bombardment in vacuum. World Acad. Sci. Eng. Technol., 4: 192-195.
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