Dr. Jiaohua Qin

Professor
Hunan City University, China


Highest Degree
Ph.D. in Computer Application from Hunan University, China

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Area of Interest:

Computer Sciences
Network Security
Steganography
Digital Forensics
Digital Watermarking

Selected Publications

  1. Xia, Z., X. Sun, J. Qin and C. Niu, 2009. Feature selection for image steganalysis using hybrid genetic algorithm. Inform. Technol. J., 8: 811-820.
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  2. Xia, B., X. Sun, J. Qin, 2009. Steganalysis based on neighbourhood node degree histogram for LSB matching steganography. Proceedings of the International Conference on Multimedia Information Networking and Security, November 18th-20th, Wuhan, China..

  3. Qin, J., X. Sun, X. Xiang and C. Niu, 2009. Principal feature selection and fusion method for image steganalysis. J. Elect. Imag., 18: 1-14.
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  4. Niu, C., X. Sun, J. Qin, Z. Xia, 2009. Steganalysis of two least significant bits embedding based on least square method. Proceedings of the International Colloquium on Computing, Communication, Control and Management, August 8-9, Sanya, China..

  5. Xiaoyan, C., S. Xingming, Q. Jiaohua, 2007. A new steganalysis algorithm using correlation of adjacent pixels. Appl. Res. Comput., 24: 128-130.

  6. Xiang, X., D. Zhang, J. Qin, 2007. An improve algorithm for the longest common subsequence problem. Proceedings of the International Conference on Convergence Information Technology, Nov. 21-23, IEEE Xplore London, pp: 637-639.

  7. Xiang, X., D. Zhang, J. Qin, 2007. A new algorithm for the longest common subsequence problem. Proceedings of the International Conference on Computational Intelligence and Security Workshops, (ICCISW`2007), Melbourne, pp: 112-115.

  8. Qin, J.H., X.M. Sun and X.Y. Cheng, 2007. Steganalysis based on statistical characteristic of adjacent pixels for LSB steganography. J. Syst. Simulat., 19: 5856-5860.

  9. Jiao-Hua, Q., S. Xing-Ming, C. Xiao-Yan, 2007. Steganalysis based on lifting wavelet transform for palette images. Proceedings of the International Conference on Computational Intelligence and Security Workshops, Dec. 15-19, IEEE Xplore London, pp: 672-675.
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